In the next few years, 3D sensing technology is expected to become increasingly common in consumer electronics devices such as smart phones, and will be widely deployed in various automotive and industrial applications. Based on VCSEL (vertical cavity surface emitting laser) technology Laser diodes form the core of 3D sensors and must be tested throughout the supply chain. As demand grows, manufacturers face the challenge of improving test capabilities while saving space. The compact shape of the Model 2606B means test engineers. And system integrators can significantly increase the channel capacity of each rack without adding more racks of test equipment.
The new Model 2606B is equivalent to using two Keithley Model 2602B system source tables to form a 4-channel, 1U full-rack unit. For many system integrators who test laser diodes, floor space is a critical parameter and upgrades to higher densities. The solution does not require the addition of a test equipment rack. The 1U form factor of the Model 2606B increases the density by a factor of 3 because there is no need to consider the heat dissipation interval between the units.
The Model 2606B provides accurate current and voltage sources, 6-bit measurement resolution and 0.015% basic measurement accuracy. These specifications are identical to the existing 2601B and 2602B models, ensuring measurement correlation between different models. It also uses The same analog I/O and TSP-Link connectors eliminate the need for different connectors and cables and help reduce test costs.