The staff of the microelectronics and nanoelectronics departments of the Moscow State Polytechnic Institute at the Russian State University of Nuclear Science and Technology proposed a new technical solution for predicting the failure of space-integrated microcircuits.
Modern meteorological satellites, communications satellites and Earth observation satellites should be in orbit for at least 10 years - 15 years, the cause of which is usually the failure of airborne electronic equipment. Now, the size of integrated circuit components is reduced to nano-scale, which led to a variety of failures, For example, a cosmic particle can cause errors in several logic elements or memory cells at the same time, causing faulty or irreversible damage.
To solve this problem, the research team invented a new method that can handle the results of ground tests and calculate the frequency of fault occurrences, and can technically and programmatically predict the newly designed modern nano-integrated circuits, so as to effectively avoid Its many failures in space.
