Mentor Tessent VersaPoint test point technology helps Renesas reduce costs and improve quality

Meets a Micron News, Mentor, a Siemens business today announced today the availability of VersaPoint ™ test point technology in Tessent® ScanPro and Tessent Logic BIST products that still meet the quality certification requirements of ISO 26262. VersaPoint test point technology not only reduces manufacturing test costs, but also Improve Quality in System Tests - These are two key requirements for high-quality ICs in automotive and other industries. Mentor also announced that Renesas Electronics has adopted VersaPoint technology in its automotive IC to address safety Critical test requirements to achieve ASIL C and D certification standards.

Digital circuits in automotive ICs are typically tested using a combination of on-chip compression / ATPG and logic built-in self-test (LBIST) techniques to achieve exceptionally high defect coverage of manufacturing tests for system testing and power-on self-testing.

Test points are dedicated design structures used to improve test performance. Traditional LBIST test points improve test results by addressing "stochastic pattern impairments" in the IC. Mentor recently developed test points specifically for on-chip compression / ATPG mixed use, When using only on-chip compression, the number of ATPG modes can be reduced by a factor of 2 to 4. Tessent VersaPoint test point technology combines these technologies and builds upon them.

'To deliver industry-leading automotive IC products, Renesas uses test points to help meet stringent IC test requirements,' said Hisanori Ito, vice president, Automotive SoC Business Unit, Renesas Electronics Corporation. "With Tessent VersaPoint test point technology, we no longer need to address Different types of ICs use separate solutions so that we can improve quality and reduce costs with just manufacturing and in-system testing. The simplified DFT implementation process also shortens development cycles and speeds time-to-market. '

Compared to traditional LBIST test points, Tessent VersaPoint technology improves LBIST test coverage, while reducing the number of ATPG modes better than using on-chip compression / ATPG test points.This technique is designed for use with Tessent Designed by test engineers who mix ATPG / LBIST technology to reduce test costs and improve test quality, especially for IC products intended for automotive applications.

'As the size of the design continues to grow and the quality requirements become more stringent, our customers are constantly striving to reduce the cost of testing,' said Brady Benware, director of marketing for Mentor Tessent 'products. "At the same time, the marketplace for high-reliability applications Demand for efficient in-system testing continues to grow, and with VersaPoint test point technology, our customers can meet more manufacturing and system-testing requirements in a more efficient way. "